DAC121S101-SEP
Radiation-tolerant, single-channel, low-power (0.57mW) 12-bit 5.5V digital-to-analog converter
DAC121S101-SEP
- Radiation tolerance:
- Total ionizing dose (TID): 30krad (Si)
- Single-event latch-up (SEL): 43MeV-cm2/mg
- Single-event functional interrupt (SEFI): 43MeV-cm2/mg
- Space-enhanced plastic (space EP):
- Outgassing test performed per ASTM E595
- Vendor item drawing (VID) V62/24641
- Supports defense and aerospace application temperature range: –55°C to +125°C
- Controlled baseline
- One assembly and test site
- One fabrication site
- Extended product life cycle
- Product traceability
- Specified monotonicity
- Low-power operation
- Rail-to-rail voltage output
- Power-on reset to zero-scale output
- Wide power-supply range of 2.7V to 5.5V
- Small package:
- 8-pin VSSOP (3mm × 3mm)
- Power-down feature
- Key specifications:
- 12-bit resolution
- DNL: −0.15LSB, +0.35LSB (typical)
- 12µs output settling time (typical)
- 4mV zero-code error (typical)
- Full-scale error at −0.07%FSR (typical)
The DAC121S101-SEP device is a full-featured, general-purpose, 12-bit voltage-output digital-to-analog converter (DAC) that can operate from a single 2.7V to 5.5V supply and consumes just 177µA (typical) of current at 3.6V. The on-chip output amplifier allows rail-to-rail output swing and the three wire serial interface operates at clock rates up to 30MHz over the specified supply voltage range and is compatible with standard SPI, QSPI, MICROWIRE and DSP interfaces.
The supply voltage serves as the voltage reference for the DAC121S101-SEP, providing the widest possible output dynamic range. A power-on reset circuit powers up the DAC output to zero volts until there is a valid write to the device. A power-down feature reduces power consumption to less than a microwatt (typical).
Technical documentation
Type | Title | Date | ||
---|---|---|---|---|
* | Data sheet | DAC121S101-SEP 12-Bit, Micro Power, RRO Digital-to-Analog Converter datasheet | PDF | HTML | 11 Dec 2024 |
* | Radiation & reliability report | DAC121S101-SEP Single-Event Latch-Up (SEL) Radiation Report | PDF | HTML | 13 Dec 2024 |
* | Radiation & reliability report | DAC121S101-SEP Radiation Tolerant, CMOS, 12-Bit Digital to Analog Converter (DAC) TID Report | PDF | HTML | 12 Dec 2024 |
* | Radiation & reliability report | DAC121S101-SEP Production Flow and Reliability Report | PDF | HTML | 11 Dec 2024 |
EVM User's guide | DAC121S101-SEP Evaluation Module User's Guide | PDF | HTML | 27 Sep 2024 |
Design & development
For additional terms or required resources, click any title below to view the detail page where available.
DAC121S101SEPEVM — DAC121S101-SEP evaluation module
The DAC121S101-SEP evaluation module (EVM) is an easy-to-use platform to evaluate the functionality and performance of the DAC121S101-SEP device. The EVM has optional circuits and jumpers to configure the device for different applications.
The DAC121S101-SEP device is a full-featured, (...)
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Package | Pins | CAD symbols, footprints & 3D models |
---|---|---|
VSSOP (DGK) | 8 | Ultra Librarian |
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