LMG2650EVM-100
LMG2650 half-bridge daughtercard evaluation module
LMG2650EVM-100
概要
The LMG2650EVM-100 is designed to provide a quick and easy platform to evaluate TI integrated GaN devices in any half-bridge topology. The board is designed to be interfaced with a larger system using the 6 power pins and 12 digital pins on the bottom edge of the board in a socket-style external connection. Power pins form the main switching loop consisting of a high-voltage DC bus, switch node and power ground. The digital pins control the LMG2650 device with PWM gate inputs, provide auxiliary power with low-voltage supplies, and report faults as a digital output. Evaluating the LMG2650EVM-100 performance is most easily demonstrated using a synchronous buck/boost motherboard from TI (LMG342X-BB-EVM). The daughtercard easily plugs into the motherboard and interfaces all power and digital control in an open-loop configuration for full system control. Additionally, a recommended footprint is provided to interface the daughtercard with a custom system for further testing.
特長
- Input voltage operation up to 650V
- Simple open-loop design to evaluate performance of LMG2640
- Single or dual PWM input on board for PWM signal with variable dead time
- Highly integrated GaN power-FET half bridge with low-side current-sense emulation output
- Convenient probe points for logic and power stage measurements with oscilloscope probes having short ground spring probes
窒化ガリウム (GaN) 電力段
購入と開発の開始
LMG2650EVM-100 — LMG2650 half-bridge daughtercard evaluation module
技術資料
| 種類 | タイトル | 英語版のダウンロード | 日付 | |||
|---|---|---|---|---|---|---|
| EVM ユーザー ガイド (英語) | LMG2650 Half-Bridge Daughtercard Evaluation Module User's Guide | PDF | HTML | 2024年 12月 4日 |