AFE2256EVM

AFE2256 256-channel AFE for digital X-ray flat-panel detectors evaluation module

AFE2256EVM

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Overview

The AFE2256EVM is a compact USB based evaluation kit for evaluating the AFE2256 COF, a 256-channel analog front-end. The EVM is self-contained with DACs and power generation on-board which greatly reduces its dependency on external equipment. The kit consists of an EVM and two separate COF adapters along with easy-to-use software that allows performance evaluation of the COF devices. The COF Adapter is detachable and thus multiple COF Adapters can be evaluated using a single EVM setup. The USB 2.0 interface provides fast configuration downloads and FPGA-PC communication through a microcontroller.

Features
  • Allows quick evaluation of AFE2256 COF devices (externally detachable)
  • GUI software allows easy control of AFE2256 device modes and functions
  • On board 3.3V and 1.8V DUT power generation
  • On board FPGA based pattern generation and data acquisition
  • Communicates with Personal Computer through a USB 2.0 interface


2 COF Adapter Boards
AFE2256 FPGA Board
Power Cable
USB 2.0 Cable

Digital X-ray AFEs
AFE2256 256-channel analog front end (AFE) for digital X-ray flat-panel detectors

 

Linear & low-dropout (LDO) regulators
LP38798 800-mA, 20-V, low-noise, high-PSRR, adjustable low-dropout voltage regulator with enable

 

Multi-channel ICs (PMICs)
TPS75003 Integrated and configurable Power Management IC (PMIC) with two buck controllers and one LDO

 

Precision DACs (≤10 MSPS)
DAC9881 18-bit, single-channel, low-noise, voltage output DAC for high accuracy applications

 

Precision op amps (Vos<1mV)
LMP7731 Single 2.9 nV/sqrt(Hz) Low Noise, Precision, RRIO Amplifier LMP7732 Dual 2.9 nV/sqrt(Hz) Low Noise, Precision, RRIO Amplifier
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Evaluation board

AFE2256EVM — AFE2256 256-channel AFE for digital X-ray flat-panel detectors evaluation module

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Technical documentation

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Type Title Date
* EVM User's guide AFE2256EVM Introduction User's Guide 24 Nov 2015
Certificate AFE2256EVM EU Declaration of Conformity (DoC) 02 Jan 2019

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