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TPS7H1121-SP

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Radiation-hardened, QMLV and QMLP, 2.25V to 14V input, 2A low-dropout (LDO) regulator

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Data sheet

TPS7H1121-SP

ACTIVE
Data sheet Order now

Product details

Output options Adjustable Output Iout (max) (A) 2 Vin (max) (V) 14 Vin (min) (V) 2.25 Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Rating Space Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Features Adjustable current limit, Enable, Power good, Soft start Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
Output options Adjustable Output Iout (max) (A) 2 Vin (max) (V) 14 Vin (min) (V) 2.25 Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Rating Space Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Features Adjustable current limit, Enable, Power good, Soft start Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
CFP (HFT) 22 60.221856 mm² 6.211 x 9.696
  • Total Ionizing Dose radiation characterized:

    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range
  • Total Ionizing Dose radiation characterized:

    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. It is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. It is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.
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Technical documentation

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Type Title Date
* Data sheet TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator datasheet (Rev. A) PDF | HTML 24 Sep 2024
* Radiation & reliability report TPS7H1121-SP Neutron Displacement Damage (NDD) Characterization Report PDF | HTML 19 Sep 2024
* Radiation & reliability report TPS7H1121-SP Total Ionizing Dose (TID) Radiation Report PDF | HTML 19 Sep 2024
* Radiation & reliability report TPS7H1121-SP Single-Event Effects (SEE) PDF | HTML 18 Sep 2024
Application brief DLA Approved Optimizations for QML Products (Rev. B) PDF | HTML 17 May 2024
EVM User's guide TPS7H1121EVM-CVAL Evaluation Module User's Guide (Rev. A) PDF | HTML 17 May 2024
Certificate TPS7H1121EVM-CVAL EU Declaration of Conformity (DoC) 05 Apr 2024
Selection guide TI Space Products (Rev. J) 12 Feb 2024
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 31 Aug 2023
Application note QML flow, its importance, and obtaining lot information (Rev. C) 30 Aug 2023
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 17 Nov 2022
Application note DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 21 Aug 2020
Application note Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form PDF | HTML 18 May 2020
E-book Radiation Handbook for Electronics (Rev. A) 21 May 2019

Design & development

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Evaluation board

TPS7H1121EVM-CVAL — TPS7H1121-SP evaluation module

The TPS7H1121EVM-CVAL demonstrates the operation of a single TPS7H1121-SP LDO regulator. The board provides footprints that can be populated with additional components to allow for testing of customized configurations, as well as test points and SMA connectors for easy performance validation.
User guide: PDF | HTML
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CFP (HFT) 22 Ultra Librarian
TI's Standard Terms and Conditions for Evaluation Items apply.

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