SNVA920B January   2020  – September 2021 LM61430-Q1 , LM61435-Q1 , LM61440-Q1 , LM61460-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)
  5. 5Revision History

1 Overview

This document contains information for LM61430-Q1, LM61435-Q1, LM61440-Q1, and LM61460-Q1 (VQFN-HR package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-BEAAD164-8E4E-4D4B-BCF7-574C030E5BBD-low.gif Figure 1-1 Functional Block Diagram

LM61430-Q1, LM61435-Q1, LM61440-Q1, and LM61460-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.