SLLSFN1
May 2021
ISOS141-SEP
PRODUCTION DATA
1
Features
2
Applications
3
Description
4
Revision History
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Power Ratings
6.6
Insulation Specifications
6.7
Safety-Related Certifications
6.8
Safety Limiting Values
6.9
Electrical Characteristics—5-V Supply
6.10
Supply Current Characteristics—5-V Supply
6.11
Electrical Characteristics—3.3-V Supply
6.12
Supply Current Characteristics—3.3-V Supply
6.13
Electrical Characteristics—2.5-V Supply
6.14
Supply Current Characteristics—2.5-V Supply
6.15
Switching Characteristics—5-V Supply
6.16
Switching Characteristics—3.3-V Supply
6.17
Switching Characteristics—2.5-V Supply
6.18
Insulation Characteristics Curves
6.19
Typical Characteristics
7
Operating Life Deration
8
Parameter Measurement Information
9
Detailed Description
9.1
Overview
9.2
Functional Block Diagram
9.3
Feature Description
9.3.1
Radiation Tolerance
9.3.2
Electromagnetic Compatibility (EMC) Considerations
9.4
Device Functional Modes
9.4.1
Device I/O Schematics
10
Application and Implementation
10.1
Application Information
10.2
Typical Application
10.2.1
Design Requirements
10.2.2
Detailed Design Procedure
10.2.3
Application Curve
10.2.3.1
Insulation Lifetime
11
Power Supply Recommendations
12
Layout
12.1
Layout Guidelines
12.1.1
PCB Material
12.2
Layout Example
13
Device and Documentation Support
13.1
Documentation Support
13.1.1
Related Documentation
13.2
Receiving Notification of Documentation Updates
13.3
Community Resources
13.4
Trademarks
14
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
DBQ|16
MSOI004H
Thermal pad, mechanical data (Package|Pins)
Orderable Information
sllsfn1_oa
sllsfn1_pm
1
Features
Radiation Tolerant
Total Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)
TID RLAT/RHA = 30 krad(Si)
Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm
2
/mg at 125°C
Single-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm
2
/mg) at 500 V
DC
Space Enhanced Plastic (Space EP)
Meets NASA’s ASTM E595 Outgassing Spec
Vendor Item Drawing (VID)
V62/21610
Military Temp Range (-55°C to 125°C)
One Wafer Fabrication Site
One Assembly and Test Site
Gold Bond Wire, NiPdAu Lead Finish
Wafer Lot Traceability
Extended Product Life Cycle
Extended Product Change Notification
600 V
RMS
continous working voltage
Section 6.7
:
DIN VDE V 0884-11:2017-01
UL 1577 component recognition program
100 Mbps data rate
Wide supply range: 2.25 V to 5.5 V
2.25-V to 5.5-V level translation
Default output
low
Low power consumption, 1.5 mA per channel typical at 1 Mbps
Low propagation delay: 10.7 ns typical (5-V Supplies)
Low channel-to-channel skew: 4 ns max (5-V Supplies)
±100 kV/μs typical CMTI
System-level ESD, EFT, Surge, and Magnetic Immunity
Small QSOP (DBQ-16) package